4. Measurement of highly charged ion emission line spectrum by electron beam ion trap
Instructors: Dr. Hiroyuki A. Sakaue, Prof. Izumi Murakami, and Dr. Daiji Kato
Emission line spectrum data of tungsten highly charged ions, which are impurities in high temperature plasma, are being actively studied all over the world.
In this topic, highly charged ions of various elements related to fusion plasma are generated and trapped by using a special device called an electron beam ion trap (EBIT). And emission line spectra from the highly charged ions due to collision with electron beam will be measured. Also, the measured emission line spectra will be analyzed using a collisional radiative model.
Electron Beam Ion Trap (EBIT)